K shell absorption jump ratios and jump factor measurements for some elements in the range of 40 <= Z <= 50

Abstract

In this study, K shell absorption jump ratios (J(K) ) and jump factors (r(K)) of specimens in the atomic number range of 40 <= Z <= 50 were measured using the energy dispersive X-ray fluorescence (EDXRF) technique. Related specimens were excited using 59.54 keV gamma-photons that were radiated from a Am-241 point source. Typical K X-rays emitting from specimens were detected from silicon drifted lithium (Si(Li)) semiconductor detector. Derived J(K) and r(K) values of related specimens were compared with calculated theoretical and other experimental values. The agreement of measured values was reasonable with theoretical calculations.